SYNTHETIC OVERVIEW OF STRUCTURAL ANALYSIS METHODS FOR METALLIC MATERIALS USING X-RAY DIFFRACTION

Abstract

Abstract. Identifying the structure of a material is not a trivial investigation process, especially considering the scale at which the investigation should be performed. An important method for such a study is the one known as "X-ray diffraction structure analysis". The initial purpose of X-ray diffraction was and remains to identify the structure of an unknown material. This type of analysis is much more favorable for the analysis of monocrystals of different substances, but for the analysis of polycrystalline materials the variant known as the "powder method" is used. Structural analysis by X-ray diffraction is based on X-ray diffraction by atomic planes inside the crystals. The result of the diffraction is the so-called diffraction pattern which is visualized in graphic form. This "diffraction pattern" has as its main characteristics the "peaks" or "diffraction maxima", which represent the angles (expressed as 2q, q being the angle expressed in degrees) at which the diffraction maxima are obtained.